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1.
In this article, we discuss the optimal allocation problem in a multiple stress levels life‐testing experiment when an extreme value regression model is used for statistical analysis. We derive the maximum likelihood estimators, the Fisher information, and the asymptotic variance–covariance matrix of the maximum likelihood estimators. Three optimality criteria are defined and the optimal allocation of units for two‐ and k‐stress level situations are determined. We demonstrate the efficiency of the optimal allocation of units in a multiple stress levels life‐testing experiment by using real experimental situations discussed earlier by McCool and Nelson and Meeker. Monte Carlo simulations are used to show that the optimality results hold for small sample sizes as well. © 2006 Wiley Periodicals, Inc. Naval Research Logistics, 2007  相似文献   
2.
针对无线传感器网络中瓶颈节点和准瓶颈节点对网络影响的特例性问题,将重要节点的概念推广到对节点介数的研究,提出了基于介数中心性重要节点的能量均衡机制。该机制将介数值大于网络平均介数值的节点判定为重要节点,并利用重要节点的邻居节点建立缓冲机制来减少其数据的转发次数,在牺牲较少数据传输延时的情况下节省了介数中心性重要节点的能量消耗。仿真实验表明该机制能够较好地均衡无线传感器网络中的节点能耗,提高了网络生命周期。  相似文献   
3.
Today, many products are designed and manufactured to function for a long period of time before they fail. Determining product reliability is a great challenge to manufacturers of highly reliable products with only a relatively short period of time available for internal life testing. In particular, it may be difficult to determine optimal burn‐in parameters and characterize the residual life distribution. A promising alternative is to use data on a quality characteristic (QC) whose degradation over time can be related to product failure. Typically, product failure corresponds to the first passage time of the degradation path beyond a critical value. If degradation paths can be modeled properly, one can predict failure time and determine the life distribution without actually observing failures. In this paper, we first use a Wiener process to describe the continuous degradation path of the quality characteristic of the product. A Wiener process allows nonconstant variance and nonzero correlation among data collected at different time points. We propose a decision rule for classifying a unit as normal or weak, and give an economic model for determining the optimal termination time and other parameters of a burn‐in test. Next, we propose a method for assessing the product's lifetime distribution of the passed units. The proposed methodologies are all based only on the product's initial observed degradation data. Finally, an example of an electronic product, namely contact image scanner (CIS), is used to illustrate the proposed procedure. © 2002 Wiley Periodicals, Inc. Naval Research Logistics, 2003  相似文献   
4.
Instead of measuring a Wiener degradation or performance process at predetermined time points to track degradation or performance of a product for estimating its lifetime, we propose to obtain the first‐passage times of the process over certain nonfailure thresholds. Based on only these intermediate data, we obtain the uniformly minimum variance unbiased estimator and uniformly most accurate confidence interval for the mean lifetime. For estimating the lifetime distribution function, we propose a modified maximum likelihood estimator and a new estimator and prove that, by increasing the sample size of the intermediate data, these estimators and the above‐mentioned estimator of the mean lifetime can achieve the same levels of accuracy as the estimators assuming one has failure times. Thus, our method of using only intermediate data is useful for highly reliable products when their failure times are difficult to obtain. Furthermore, we show that the proposed new estimator of the lifetime distribution function is more accurate than the standard and modified maximum likelihood estimators. We also obtain approximate confidence intervals for the lifetime distribution function and its percentiles. Finally, we use light‐emitting diodes as an example to illustrate our method and demonstrate how to validate the Wiener assumption during the testing. © 2008 Wiley Periodicals, Inc. Naval Research Logistics, 2008  相似文献   
5.
柴油机自然寿命分析   总被引:4,自引:1,他引:3  
将柴油机重要运动部件的磨损率和磨损量以及容许磨损量当作随机变量,建立计算这些部件寿命的数学模型,通过计算可得到它们的寿命,从而确定柴油机的自然寿命.与传统的计算方法相比,该方法计算精度高.该方法已用于论证舰船服役年限.  相似文献   
6.
We propose a nonparametric Bayesian lifetime data analysis method using the Dirichlet process mixture model with a lognormal kernel. A simulation‐based algorithm that implements the Gibbs sampling is developed to fit the Dirichlet process lognormal mixture (DPLNM) model using rightly censored failure time data. Five examples are used to illustrate the proposed method, and the DPLNM model is compared to the Dirichlet process Weibull mixture (DPWM) model. Results indicate that the DPLNM model is capable of estimating different lifetime distributions. The DPLNM model outperforms the DPWM model in all the examples, and the DPLNM model shows promising potential to be applied to analyze failure time data when an appropriate parametric model for the data cannot be specified. © 2013 Wiley Periodicals, Inc. Naval Research Logistics, 2013  相似文献   
7.
步进加速退化试验及其在电子产品可靠性评估中的应用   总被引:1,自引:0,他引:1  
为快速评估具有高可靠、长寿命特点的电子产品的可靠性,提出了使用步进加速退化试验技术的方法。文中首先给出了步进加速退化的试验方法及基本假设,然后给出了步进退化数据向恒加退化数据的折算方法,在此基础上提出了基于伪失效寿命的步进加速退化可靠性评估算法,最后利用试验数据对该方法进行了验证。该方法与恒加退化试验相比,在保持样本量不变的基础上,可以极大地缩短试验时间,因此,具有更高的效费比。  相似文献   
8.
Weibull型产品的可靠性验证   总被引:6,自引:0,他引:6       下载免费PDF全文
讨论了Weibull型产品的可靠性验证问题 ,首先分析了Weibull型产品分布参数的无信息验前分布问题 ,利用验前信息可以得到分布参数的验前概率密度函数 ,进而分析了产品的可靠性验证问题 ,顾及了使用方利益和生产方利益。仿真算例表明 ,使用方利益和生产方利益是相互折衷的。  相似文献   
9.
为降低网络干扰,延长生命周期,针对扇形环分簇的无线传感器网络,引入功率控制策略以改进传统的物理干扰模型和能耗模型。在此基础上,通过分析数据包产生过程,对网络干扰和生命周期进行计算。数值计算结果表明,网络中内外环宽度相差较小时,生命周期较长,但对干扰无影响;外环簇数应适当多于内环簇数;扇形环簇的数量增多时,网络干扰加剧,然而生命周期得到延长。研究结果为优化无线传感器网络中簇结构提供了依据。  相似文献   
10.
为了进一步提升设备维修决策的科学性,通过建立综合设备剩余寿命预测数据与不确定失效阈值的最优维修决策模型,实现了不可维修设备的最优替换策略。构建基于非线性Wiener过程的设备性能退化模型,并采用极大似然法估计退化模型参数;提出一种基于期望最大(Expectation Maximization, EM)算法的不确定失效阈值分布系数估计方法,通过引入虚拟失效阈值数据实现对失效阈值分布系数的同步迭代更新;基于首达时的概念推导出不确定失效阈值条件下设备剩余寿命的概率密度函数,并基于更新报酬理论建立维修决策模型,从而实现设备的最优维修决策。算例分析表明,设备的失效阈值会对维修决策结果产生重要影响,考虑设备失效阈值的不确定性既有助于提升剩余寿命预测的准确性,又可以有效降低设备的寿命周期费用。  相似文献   
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